MCL-HS100
Halogen Free, High Tg, Low Transmission Loss, Low CTE Multilayer Material
About the product
- Product
- CCL
-
MCL-HS100
- Prepreg
-
GH-100
- Applications
- Semiconductor packages (FC-CSP, PoP, SiP)
- Thinner Module PWB
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Features
- MCL-HS100 has hybrid properties of package and high speed materials.
- MCL-HS100 has low CTE value in X, Y directions and good dielectric property. (Dk 3.7, Df 0.0040 at 10 GHz)
- MCL-HS100(Type D) achieved low dielectric constant (3.4 at 10 GHz) and low dissipation factor (0.0025 at 10 GHz) using low Dk glass.
- Well-suited for build-up construction.
Characteristics
Warpage of Coreless 5-layer
- TEG Chip
-
- Package size: 14 mm×14 mm
- Chip size: 7.3 mm×7.3 mm
- Chip thickness: 150 µm
- Underfill thickness: 60 µm (CEL-C-3730-4)
- TEG Substrate
-
- L1, 5: 12 µm Cu100%, L2, 3, 4: No copper, SR: -
- Prepreg construction
-
- GH-100 (Type D) (1078, R.C.63%)×4 ply
- GEA-700G (1078, R.C.66%)×4 ply
- GEA-705G (1078, R.C.65%)×4 ply
Transmission Loss
Measurement conditions
- Evaluation PWB: Strip-line
- Temperature & Humidity: 25℃/60%RH
- Characteristic impedance: Approx.50Ω
- Proofreading method: TRL (Thru-Reflect-Line)
- Trace width(w): 0.12–0.14 mm
- Dielectric thickness(b): 0.25 mm
- Trace thickness(t): 18 µm
Copper Clad Laminate
- ※1 Heating Rate: 10℃/min.(Comp.)
- ※2 Measured by Cavity Resonator.
- ※3 Refer to "Condition Note"
- ※ Above data are experimental results and not guaranteed.
Standard Specifications
Copper Clad Laminate
Note 1) LP/HVLP: Low profile copper foil.
Note2)Laminate thickness means dielectric layer thickness.
Prepreg
- ※1) The dielectric thickness after lamination is defined as the thickness of one sheet of prepreg when the resin flow is 0%.
- Values change depending on the press condition or inner layer pattern.
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