MCL-E-795G
Halogen Free, High Tg, High Elastic Modulus and Low CTE material
About the product
- Product
- CCL
-
MCL-E-795G
- Prepreg
-
GEA-795G
- Applications
- Semiconductor packages. (FC-BGA)
- Center core of buildup construction.
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Features
- MCL-E-795G has low CTE value in X, Y directions and can reduce warpage of package significantly.
- MCL-E-795G (Type LH) has low CTE value.
- Well-suited for center core of buildup construction.
Characteristics
Warpage Performance [3-2-3 construction]
- TEG Chip
-
- Die size: 20 mm×20 mm
- Die height: 775 µm
- TEG Substrate
-
- Package size: 40 mm×40 mm
- Core thickness: 0.4 mm / 0.8 mm
- BU thickness: 20 µm
- SR thickness: 19 µm
Copper Clad Laminate
- ※1 Heating Rate: 10℃/min.
- ※2 800 μm thickness.
- ※3 Measured by SPDR.
- ※4 Refer to "Condition Note"
- ※ Above data are experimental results and not guaranteed.
Standard Specifications
Copper Clad Laminate
- ※1 STD: Standard copper foil, LP: Low Profile copper foil.
- ※2 The thickness means that of dielectric layer.
Prepreg
- ※1 The dielectric thickness after lamination is defined as the thickness of one sheet of prepreg when the resin flow is within 0%.
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