MCL-E-770G (Type R)
Halogen Free, High Tg, High Elastic Modulus, Low CTE Multilayer Material
About the product
- Product
- CCL
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MCL-E-770G (Type R)
- Prepreg
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GEA-770G
- Applications
- Semiconductor packages. (FC-CSP, PoP, SiP)
- Thinner module.
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Features
- MCL-E-770G has low CTE values in X, Y directions and reduces warpage of package substrate significantly.
- MCL-E-770G (Type RLH) has lower CTE value (less than 2.0 ppm/℃).
Characteristics
Warpage of FC-CSP
- TEG Chip
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- Chip size: 7.3 mm×7.3 mm
- Chip thickness: 150 µm
- Underfill thickness: 60 µm (CEL-C-3730-4)
- Solder Resist thickness: 20 µm (FZ-2700GA)
- TEG Substrate
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- Package size: 14 mm×14 mm
- Core Thickness 200 µm+1024 (S-HD)prepreg
Copper Clad Laminate
- ※1 Heating Rate: 10℃/min.(Comp.)
- ※2 Measured by SPDR.
- ※3 Refer to "Condition Note"
- ※4 t0.8mm
- ※t0.4mm thickness core is used depending on test item.
- ※ Above data are experimental results and not guaranteed.
Standard Specifications
Copper Clad Laminate
Note 1) STD: Standard copper foil, LP: Low profile copper foil, PF: Profile free copper foil.Note 2) Laminate thickness means dielectric layer thickness.
Prepreg
※1) The dielectric thickness after lamination is defined as the thickness of one sheet of prepreg when the resin flow is 0%. Values change depending on the press condition or inner layer pattern.
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